High Performance Functional Test Solutions for Mission-Critical Boards, LRUs and Systems


TS-323 Dual Bay Configuration


TS-321 Single Bay Configuration


GENASYS Innovative Mixed-Signal Test System Platform


0 PXI-based architecture offers compact footprint and expandability 0 Innovative signal switching, hybrid pin architecture for digital and mixed-signal test 0 Scalable architecture supports up to 4500 interface test points 0 Comprehensive software migration tools for upgrading / replacing legacy Teradyne L200/L300, GenRad 2750 and VXI-based functional test systems and test programs


GX7016 / GX7017 Modular, Hybrid Switching


Subsystem


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