search.noResults

search.searching

dataCollection.invalidEmail
note.createNoteMessage

search.noResults

search.searching

orderForm.title

orderForm.productCode
orderForm.description
orderForm.quantity
orderForm.itemPrice
orderForm.price
orderForm.totalPrice
orderForm.deliveryDetails.billingAddress
orderForm.deliveryDetails.deliveryAddress
orderForm.noItems
Sponsored by


Solving challenges Some of the key challenges that custom- ers face in the design and test of high- speed serial interfaces have already been mentioned. We asked T&M equipment vendors about challenges their custom- ers are taking on, and the solutions those vendors are providing to help. Akretch, Rohde & Schwarz: Te R&S


S Signal Microwave’s 40 GHz top launch connector will be on display at DesignCon.


software with our simulation software,” Asay said, adding that Keysight will show its expertise in 400GbE with both Tx and Rx solution demonstrations. The folks at Teledyne will exhibit a


new test solution for PCI Express Gen5 physical-layer transmitter and receiver testing. This solution centers on the company’s LabMaster 10 Zi-A oscillo- scope and includes automated receiver test calibration for Anritsu’s MP1900A signal-quality analyzer. Also featured at DesignCon for Teledyne is its WavePro HD—an 8-GHz, 12-bit oscilloscope ideal- ly suited to PI analysis, particularly when paired with Teledyne’s RP4030 voltage- rail probe. In terms of protocol analyz- ers, the company will exhibit the Eclipse M42x Protocol Analyzer/Exerciser for universal flash storage and the Envision X84 Protocol Analyzer for MIPI C-PHY and D-PHY. Teledyne will also showcase the Summit M5x PCIe Analyzer and Jam- mer, which is PCIe Gen5 capable. See it all at booth No. 519. Signal Microwave, at DesignCon, will


highlight a turnkey TRL/LRL calibra- tion system for SMD testing, and a new 40 GHz top launch connector for easier board design and improved performance over current vertical launch connectors. Tektronix’ booth at DesignCon will


exhibit four solutions: its 400G PAM4 & Coherent Optical; the PCIe GEN 5 ad- vances on the TEK BSX BERTScope Se- ries; consumer-based USB & HDMI; and memory-based DDR 5 & LPDDR 5.


8 EVALUATION ENGINEERING JANUARY 2019


FSWP Phase Noise Analyzer and VCO Tester offers the functionality needed to test low-jitter clocks in both SSC OFF mode and SSC ON mode. It provides very high AM suppression in the phase noise measurement and excellent phase noise sensitivity for precise jit- ter measurements on low-jitter clocks for modern high-speed digital designs. For multiport measurements, Te R&S ZNBT is the only true multiport vector network analyzer with up to 24 ports. It enables engineers to characterize cross- talk with a single connection, increase production throughput, and with an op- timized user interface and multiport— get it done quickly. On the VNA side, and in comparison to traditional TDR solutions, the R&S ZNB Vector Net- work Analyzer offers all the function- ality needed to test digital high-speed signal structures on PCBs in one box. Additional de-embedding tools can be


installed on the instrument to remove the effects of probes, probe pads, vias, lead-ins, and lead-outs. Diwan, Tektronix: “One of the big-


gest challenges for customers is getting their devices into loopback to perform jitter tolerance test. This cuts across standards such as PCIE and USB. Vali- dation teams aren’t always sure of how many packets of TSI, TSEQ they need to send device to get it into loopback. This leads to a time-consuming and difficult trial-and-error of configuring packets. BSX Series BERTScope solu- tions for both USB and PCIE provide built-in intelligence to send packets to the point when they have handshaking from the device and getting the device into loopback while eliminating trial- and-error.” “Customers need to analyze electrical


PAM-4 signals through backplanes—in- terconnects that are highly impaired— and advanced analysis tools are required to measure and debug PAM-4 modulat- ed signals. Our Tektronix real-time scope solution (DPO-series) provides research & development with advanced tools such as digital clock recovery, visual trig- ger, BER analysis, and powerful CTLE to successfully measure PAM-4 signals—re- liably and repeatably.”


“One of the biggest challenges for customers is getting their devices into loopback to perform jitter tolerance test.” - Keyur Diwan, Tektronix


S Tektronix’ BSX Series BERTScope.


Page 1  |  Page 2  |  Page 3  |  Page 4  |  Page 5  |  Page 6  |  Page 7  |  Page 8  |  Page 9  |  Page 10  |  Page 11  |  Page 12  |  Page 13  |  Page 14  |  Page 15  |  Page 16  |  Page 17  |  Page 18  |  Page 19  |  Page 20  |  Page 21  |  Page 22  |  Page 23  |  Page 24  |  Page 25  |  Page 26  |  Page 27  |  Page 28  |  Page 29  |  Page 30  |  Page 31  |  Page 32